Ultraviolet Detector Based on TiO2 Thin Film

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In this paper, TiO2 thin film with MSM (metal-semiconductor-metal) structure was used to fabricate ultraviolet (UV) detector. The film was fabricated via sol-gel method on silicon wafer with 300nm oxide layer and annealed at four different temperatures (400oC, 500oC, 600oC and 800oC). The quality of the thin films was characterized by means of X-ray diffraction and scanning electron microscope. Then a pair of symmetric Ag electrodes were deposited by thermal evaporation through a shade mask of interdigital structure. The photo-electric properties of the device including I-V characteristic, transfer characteristic and time response et.al. were studied with or without explored to 254nm UV light. The electrical measurements of the device show a big increase of current when explored the device to 254nm UV light, and the rise time of the device is very quick, but the fall time is relatively long. The detector with simple fabrication process, low cost, and superior performance would provide a potential application in UV detectors.

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195-199

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June 2013

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© 2013 Trans Tech Publications Ltd. All Rights Reserved

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[1] G. Chai, O. Lupan, L. Chow, H. Heinrich, Crossed zinc oxide nanorods for ultraviolet radiation detection, Sens. Actuators A 150 (2009) 184-187.

DOI: 10.1016/j.sna.2008.12.020

Google Scholar

[2] A. Muller, G. Konstantinidis, M. Dragoman, D. Neculoiu, A. Dinescu, M. Androulidaki, M. Kayambaki, A. Stavrinidis, D. Vasilache, C. Buiculescu, I. Petrini, C. Anton, D. Dascalu, A. Kostopoulos, Ultraviolet MSM photodetector based on GaN micromachining, in: International Semiconductor Conference, Sinaia, 2008, pp.9-94.

DOI: 10.1109/smicnd.2008.4703336

Google Scholar

[3] G. Peng, Y. Q. Zhou, Y. L. He, X. Y. Yu, G. Y. Li, Fabrication and properties of ultraviolet photo-detectors based on SiC nanowires, SCIENCE CHINA Physics, Mechanics & Astronomy 55 (2012) 1168-1171

DOI: 10.1007/s11433-012-4790-x

Google Scholar

[4] H. Zhang, S. P. Ruan, T. J. Xie, C. H. Feng, P. F. Qu, W. Y. Chen, W. Dong, Zr0.27Ti0.73O2-Based MSM Ultraviolet Detectors With Pt Electrodes, IEEE ELECTRON DEVICE LETTERS, 32 (2011) 653-655.

DOI: 10.1109/led.2011.2110633

Google Scholar

[5] W. F. Xiang, P. R. Yang, A. J. Wang, K. Zhao, H. Ni, S. X. Zhong, Vertical geometry ultraviolet photodetectors with high photosensitivity based on nanocrystalline TiO2 films, Thin Solid Films, 520 (2012) 7144-7146.

DOI: 10.1016/j.tsf.2012.07.110

Google Scholar

[6] F. H. Babaei, S. Abbaszadeh, M. S. Esfahani, Gas sensitive porous silver-rutilehigh-temperature Schottky diode on thermally oxidized titanium, IEEE Sens. J. 9 (2009) 237-243.

DOI: 10.1109/jsen.2008.2006432

Google Scholar

[7] F. H. Babaei, S. Rahbarpour, Titanium and silver contacts on thermally oxidized titanium chip: electrical and gas sensing properties, Solid-State Electron. 56 (2011) 185-190.

DOI: 10.1016/j.sse.2010.12.007

Google Scholar

[8] M. Sreemany, A. Bose, S. Sen, A study on structural, optical, electrical and microstructural properties of thin TiOx films upon thermal oxidation: effect of substrate temperature and oxidation temperature, Phys. B 405 (2010) 85-93.

DOI: 10.1016/j.physb.2009.08.031

Google Scholar

[9] J. Xing, H. Y. Wei, E. J. Guo, F. Yang, Highly sensitive fast-response UV photodetectors based on epitaxial TiO2 films, J. Phys. D: Appl. Phys. 44 (2011) 375104-375108.

DOI: 10.1088/0022-3727/44/37/375104

Google Scholar

[10] Y. H. Chang, C. M. Liu, Y. C. Tseng, C. Chen, C. C. Chen, H. E. Cheng, Direct probe of heterojunction effects upon photoconductive properties of TiO2 nanotubes fabricated by atomic layer deposition, Nanotechnology 21 (2010) 225602-225608

DOI: 10.1088/0957-4484/21/22/225602

Google Scholar

[11] H. G. Moser, Silicon detector systems in high energy physics, Prog. Part. Nucl. Phys. 63 (2009) 186-237.

Google Scholar

[12] G. Peng, X. Y. Yu, Y. Q. Zhou, G. Wang, L. Wang, Y. L. He, The Influence of Atmosphere on Electrical Transport Properties in Bilayer Graphene FET by CVD Methods, Key Engineering Materials 531 (2013) 383-387

DOI: 10.4028/www.scientific.net/kem.531-532.383

Google Scholar