Digitized Multi-Exponential Deep-Level Transient Spectroscopy (DLTS) Using the Padé-Laplace Algorithm

Patrick Martin; Abdelaziz El Matouat; Jean Luc Lefebvre; Philippe Descamps

doi:10.4028/www.scientific.net/AMR.710.575

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HomeAdvanced Materials ResearchAdvanced Materials Research Vol. 710Digitized Multi-Exponential Deep-Level Transient...

Digitized Multi-Exponential Deep-Level Transient Spectroscopy (DLTS) Using the Padé-Laplace Algorithm

Abstract:

We apply the Padé-Laplace algorithm to automatically extract from DLTS multi-exponential transient decay measurements, the amplitude and the time constant of each discrete exponential component as well as the number of components without a priori assumption. Then, after setting restriction on the resolution of the multi-exponential problem itself due to noise, we present the field of this method numerical validity. Finally, the performance obtained on real signals is shown.