Research on Useful Life of Low Power LED Illumination Sources

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This paper reports experimental and simulation studies on degradation of optical power of low power LEDs due to current stress and temperature variation. The goal of this study was to study the effect of aging and ambient temperature on optical output power of light emitting diodes and to determine the effective lifespan of LED under stress condition. The LED samples were stressed at four levels of operating current 20mA, 30mA, 40mA, and 45mA with stress time up to 1000h. We find that degradation rate increases with increasing operating current. When LEDs are overstressed by driving at higher current the optical power degraded with stress time. A Mathematical model is developed to predict the behavior of LED at different operating current. Simulations are carried out with this model using MATLAB. Using degradation pattern at higher operating current the lifespan of LEDs was predicted at normal operating current.

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Advanced Materials Research (Volumes 760-762)

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20-24

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September 2013

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© 2013 Trans Tech Publications Ltd. All Rights Reserved

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