Defects Analysis and Reconstruction for 10kV Circuit Breaker

Ling Ling Pan; Yan Jun Peng; Yan Ning Peng

doi:10.4028/www.scientific.net/AMR.805-806.930

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HomeAdvanced Materials ResearchAdvanced Materials Research Vols. 805-806Defects Analysis and Reconstruction for 10kV...

Defects Analysis and Reconstruction for 10kV Circuit Breaker

Abstract:

The defect types of 10kV VS1 circuit breaker were surveyed in order to reduce the defective ratio. Then, the main reason of these defects was found that the opening time of circuit breaker was too long. The reasons that cause circuit breaker opening time exceed were studied, and the effective reconstruction measures were developed though test verification and analysis. To compare with the statistics before reconstruction, the result shows that the reconstruction methods using in this paper were simple and easy to perform, which can reduce the opening time of circuit breaker, improve the reliability of the devices, and play a positive role in the security and stabilization of power system. It provides a basis for improving the efficiency of characteristics test at other voltage levels.

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Periodical:

Advanced Materials Research (Volumes 805-806)

Pages:

930-934

DOI:

https://doi.org/10.4028/www.scientific.net/AMR.805-806.930

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Online since:

September 2013

Authors:

Ling Ling Pan, Yan Jun Peng, Yan Ning Peng

Keywords:

Circuit Breaker, Crank Arm, Defects Analysis, Opening Time, Reconstruction, Rotation Axis

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References

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