Dielectric Properties of PVDF/MgO Nanocomposites Thin Film with Various Annealing Temperatures

Abstract:

Poly (vinylideneflouride)/nanomagnesium oxide (PVDF/MgO) nanocomposites with MgO loading percentage of 7% were annealed with various annealing temperatures ranging from 70oC to 170oC. The PVDF/MgO(7%) thin films were fabricated using spin coating technique with MIM structure. The dielectric constant of PVDF/MgO(7%) was studied over a wide range of annealing temperatures with rapid removal from the oven once the annealing was utilized. The nanocomposites thin films annealed at temperature of 70oC (AN70) shows an improvement in the dielectric constant of 23 at 10³ Hz compared to unannealed sample (UN), which was 21 at the same frequency. However, as the annealing temperatures were increased from 90oC (AN90) to 170o C (AN170), the dielectric constant of PVDF/MgO(7%) were found to decrease from 16 to 7 respectively, which were lower than the UN thin films. AN70 also produced low value of tangent loss at low frequency˼˰˸̱̈́̾˰δ˹˰̴̷̹̹̳̱̹̾̈́̾˰̸̱̈́̈́˼˰̵̷̱̱̼̹̾̾̾˰̱̈́˰temperatures 70oC is favourable temperature used to improve the dielectric constant of PVDF/MgO(7%).

• Periodical: Advanced Materials Research (Volume 832)
• Pages: 718-723
• DOI: https://doi.org/10.4028/www.scientific.net/AMR.832.718
• Online since: November 2013
• Authors: Adillah Nurashikin Arshad, Rozana Mohd Dahan, Mohamad Hafiz Mohd Wahid, Muhamad Naiman Sarip, Habibah Zulkefle, Mohamad Rusop Mahmood
• Keywords: AFM, Dielectric Constant, MgO, Poly(vinylidene Flouride), Tangent Loss, X-Ray Diffraction (XRD)

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