The Effect of Annealing Heat Treatment on Structural and Optical Properties of ZnO Thin Films

Abstract:

ZnO thin films were deposited on simple glass substrate by sol-gel technique. The structure, morphology and luminescence of the annealed ZnO thin films were characterized by X-ray diffraction (XRD), atomic force microscope (AFM), ultra-violet spectrometer (UVS) and photoluminescence (PL) spectroscopy, respectively. The XRD experiments shows that all of the samples annealed at 300°C, 400°C, 500°C have a hexagonal wurtzite structure. Absorption spectrum shows that all the samples have high transmittance in the visible range and have a strong absorption near the band edge of ZnO. The morphology of the samples studied by the AFM shows an increase in the annealing temperature causes the surface flatter and the grain size larger. The PL spectrum shows obvious peak near 380nm.

• Periodical: Advanced Materials Research (Volumes 926-930)
• Pages: 274-277
• DOI: https://doi.org/10.4028/www.scientific.net/AMR.926-930.274
• Online since: May 2014
• Authors: Shu Cui, Cheng You Liu, Xiao Tian Li*
• Keywords: Annealing Heat Treatment, Photoluminescence (PL), Sol-Gel Method, ZnO Thin Films

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