Surface Morphology and Optical Property of Silver Nanoparticle Thin Film Prepared by Electrostatic Spray Deposition

Abstract:

Silver nanoparticle thin films were deposited on glass substrates by electrostatics spray deposition. Electrostatic spray condition was optimized by varying distance between nozzle and substrate between 20 mm and 60 mm, deposition time was fixed at 5 minute. The surface morphology and optical properties of films were carried out by using Atomic Force Microscope (AFM), Field Emission Scanning Electron Microscopy (FE-SEM) and UV-Vis Spectrophotometer. The results is indicate that the surface morphology of silver nanoparticle thin film show the grain size of film near around 100 nm at distance between nozzle and substrate of 60 mm and the RMS roughness decreases from 9.59 nm to 2.35 nm when distance between nozzle and substrate was increased from 20 mm to 60 mm. The optical absorption spectra showed the main absorption peak at 436 nm. When the distance between the nozzle and the substrate raise, decrease in absorption has been observed.

• Periodical: Advanced Materials Research (Volumes 93-94)
• Pages: 149-152
• DOI: https://doi.org/10.4028/www.scientific.net/AMR.93-94.149
• Online since: January 2010
• Authors: Y. Boonnuk, A. Chanhom, B. Tunhoo, T. Thiwawong, J. Nukeaw
• Keywords: Atomic Force Microscope (AFM), Electrostatic Spray Deposition, Field Emission Scanning Electron Microscopy (FESEM), Silver Nanoparticle Thin Film

References

[1] M.L. Scott, P.N. Arendt, R.W. Springer, R.C. Cordi, W.J. McCreary, in: H.E. Bennett, A.H. Guenther, D. Milam, B.E. Newman (Eds. ): Damage in Laser Materials, Nat. Bur. Stand. (US) Spec. Publ., Boulder, Colorado, Vol. 746 (1987), p.419.

[2] N. Thomas, A. Erlandson, J. Farmer, H. Gregg, C. Marshall, W. Siekhaus, J. Wolfe, D. Fix, D. Ahre, in: H.E. Bennett, A.H. Guenther, M.R. Kozlowski, B.E. Newnam, M.J. Soileau (Eds. ): Laser-Induced Damage in Optical Materials, Proceeding of SPIE, Boulder, Colorado, Vol. 3578, (1999).

DOI: 10.1117/12.344462

[3] Yuqing Xiong, Hao Wu, Yan Guo, Yan Sun, Dequan Yang, Daoan Da: Thin Solid Films Vol. 375 (2000), pp.300-303.

[4] A. Subrahmanyam, Ullash Kumar Barik: Physics and Chemistry of Solids Vol. 66 (2005), pp.817-822.

[5] Feng-Jin Li, Byeong-Gyu Roh, Hyun-Taek Lim, Ji-Soo Kim, Jae-Yong Park, Hong-Woo Yu, Seung-Chul Park, Yoon-Heung Tak, Byung-Chul Ahn: Thin Solid Films Vol. 517 (2009), pp.2941-2944.

DOI: 10.1016/j.tsf.2008.12.023

[6] Dongjo Kim, Sunho Jeong, Sul Lee, Bong Kyun Park, Jooho Moon: Thin Solid Films Vol. 515 (2007), pp.7692-7696.

[7] C.H. Chen, A.A.J. Buysman, E.M. Kelder, J. Schoonman: Solid State Ionics Vol. 80 (1995), p.1.

[8] O. Wilhelm, S.E. Pratsinis, D. Perednis, L.J. Gauckler: Thin Solid Films Vol. 497 (2005), p.121.

DOI: 10.1016/j.tsf.2004.11.206

[9] M. Nomura, B. Meester, J. Schoonman, F. Kapteijn, J.A. Moulijn: Sep. Purif. Technol. Vol. 32 (2003), p.387.

[10] S.C.G. Leeuwenburgh, J.C.G. Wolke, J. Schoonman, J.A. Jansen: J. Eur. Ceram. Soc. Vol. 26 (2006), p.487.

[11] E.H. Algaphe Diagne, M. Lumbreras: Sens. Actuators B Vol. 78 (2006), p.98.

[12] H. Gourari, M. Lumbreras, R. van Landschoot, J. Schoonman: Sens. Actuators B Vol. 58, (1999), p.365.