Research on Single Transistor Open Fault Diagnosis of Photovoltaic Grid-Connected Inverter

Cheng Long Hao; Li Li Xie; Jie Yang; Tao Wei; Jing Zhang

doi:10.4028/www.scientific.net/AMR.933.504

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HomeAdvanced Materials ResearchAdvanced Materials Research Vol. 933Research on Single Transistor Open Fault Diagnosis...

Research on Single Transistor Open Fault Diagnosis of Photovoltaic Grid-Connected Inverter

Abstract:

Power semiconductor device and its control circuit of photovoltaic grid-connected inverter is the weakest part in the photovoltaic generation system. Fault feature extraction is the key to the inverter fault diagnosis. Output voltage of inverter is the most sensitive characteristic quantity which can reflect its working status directly. The single transistor open fault diagnosis of photovoltaic grid-connected inverter can be achieved by extracting the output voltage frequency spectrum with the help of windowed STFT. The simulation results demonstrate the effectiveness of the method.

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Periodical:

Advanced Materials Research (Volume 933)

Pages:

504-509

DOI:

https://doi.org/10.4028/www.scientific.net/AMR.933.504

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Online since:

May 2014

Authors:

Cheng Long Hao*, Li Li Xie, Jie Yang, Tao Wei, Jing Zhang

Keywords:

Inverter Fault Diagnosis, Open Fault, Photovoltaic Grid, Voltage Frequency Spectrum

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* - Corresponding Author

References

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