In Situ Nanoscale Deformation Studies on Micro Copper Wires Using Atomic Force Microscopy

Abstract:

As the dimensions of parts become smaller, understanding the mechanical properties of these small components was becoming more important. Till present day, the methods and technology used to investigate the deformation behavior in nanoscale were still lacking. In this paper, the specimens were single crystal copper wires with diameter in 50 microns. Atomic force microscope integrated with an in- situ tensile system were used to determine the mechanical behavior of copper wires and observe the surface topography deformation in nanoscale simultaneously. The results were as follows: the modulus of elasticity, tensile strength and failure strain of the sample were 167Gpa, 0.564GPa and 0.011, respectively. By using AFM, the separation process between the copper wire and impurities on it, such as oxide film, was observed. The nanoscale deformation process of the copper wire was also obtained.

• Periodical: Advanced Materials Research (Volumes 97-101)
• Pages: 4197-4200
• DOI: https://doi.org/10.4028/www.scientific.net/AMR.97-101.4197
• Online since: March 2010
• Authors: Bo Wen Zhang, Yong Da Yan, Zhen Jiang Hu, Xue Sen Zhao, Ying Chun Liang, Wei Dong Fei, Shen Dong
• Keywords: Atomic Force Microscope (AFM), Deformation, Mechanical Property, Tensile Test

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