Gamma Profile Analysis for Stress, Texture and Grain Size

Bob B. He

doi:10.4028/www.scientific.net/AMR.996.209

Paper Titles

Looking Towards the Future of Strain Scanning Using Neutron Diffraction
p.187

Energy-Dispersive Residual Stress Analysis under Laboratory Conditions: Concept for a New Type of Diffractometer
p.192

Optimizing Experiment Performance by Realistic Sample Simulations
p.197

MYTHEN Detector – Perspectives in Residual Stress Measurements
p.203

Gamma Profile Analysis for Stress, Texture and Grain Size
p.209

About Error Calculation in X-Ray Stress Measurement
p.215

External Reference Samples for Residual Stress Analysis by X-Ray Diffraction
p.221

X-Ray Optics and Precision Requirements for Residual Stress Analyses with High Spatial Resolution
p.228

Beyond the Streetlight Effect: A United Future for Relaxation and Diffraction Methods for Residual Stress Measurement
p.234

HomeAdvanced Materials ResearchAdvanced Materials Research Vol. 996Gamma Profile Analysis for Stress, Texture and...

Gamma Profile Analysis for Stress, Texture and Grain Size

Abstract:

Two-dimensional X-ray diffraction pattern can be described by the diffraction intensity distribution in both 2θ and γ directions. The 2D pattern can be reduced to two kinds of profiles: 2θ-profile and γ-profile. The 2θ-profile can be evaluated for phase identification, crystal structure refinement and many applications with many existing algorithms and software. The γ-profile contains information on texture, stress, and crystal grain size. This article introduces the concept and fundamental algorithms for stress, texture and crystal size analysis by γ-profile analysis.

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Periodical:

Advanced Materials Research (Volume 996)

Pages:

209-214

DOI:

https://doi.org/10.4028/www.scientific.net/AMR.996.209

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Online since:

August 2014

Authors:

Bob B. He*

Keywords:

2D Detector, Grain Size, Residual Stress, Texture

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Creative Commons CC BY 4.0

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* - Corresponding Author

References

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