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HomeAdvances in Science and TechnologyAdvances in Science and Technology Vol. 52Disorder Effects on Tunneling Junctions

Disorder Effects on Tunneling Junctions

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Abstract:

This paper illustrates statistical properties of tunnel currents flowing through metalinsulator- metal tunnel junctions. A direct experiment performed on a metal-oxide junction shows that the tunnel current follows broad statistical distributions extending over more than 4 orders of magnitude. A simple lognormal law is proposed to explain the properties of currents flowing through tunnel junctions.

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Periodical:

Advances in Science and Technology (Volume 52)

Pages:

116-120

DOI:

https://doi.org/10.4028/www.scientific.net/AST.52.116

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Online since:

October 2006

Authors:

Victor Da Costa, M. Romeo

Keywords:

Broad Distributions, Fluctuation Phenomena, Lognormal Distribution, Metal-Insulator-Metal-Structures, Tunnel Junctions

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© 2006 Trans Tech Publications Ltd. All Rights Reserved

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