Thermal Conductivity Measurement of a Sb2Te3 Phase Change Nanowire

Abdelhak Saci; Jean Luc Battaglia; Andrzej Kusiak; Indrayush De; Roberto Fallica; Massimo Longo

doi:10.4028/www.scientific.net/AST.95.120

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HomeAdvances in Science and TechnologyAdvances in Science and Technology Vol. 95Thermal Conductivity Measurement of a Sb2Te3 Phase...

Thermal Conductivity Measurement of a Sb₂Te₃ Phase Change Nanowire

Abstract:

In this work we present the measurements of thermal conductivity of nanowire Sb₂Te₃ phase change. These measurements are made using a thermal scanning probe microscopy (SThM) operating in regime modulated type 3ω. The spatial resolution of the probe is of the order of 100 nm. The measurement of amplitude and phase are used to identify unknown radius of contact between the nanowire and the sensor parameters, the contact resistance at the interface probe and nanowire and the thermal conductivity of the nanowire. An identification method is used which minimizes the difference between the measured values and those from a simulated model of heat transfer in the materials. This model uses a matched model heat transfer in the probe

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Periodical:

Advances in Science and Technology (Volume 95)

Pages:

120-125

DOI:

https://doi.org/10.4028/www.scientific.net/AST.95.120

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Online since:

October 2014

Authors:

Abdelhak Saci*, Jean Luc Battaglia, Andrzej Kusiak, Indrayush De, Roberto Fallica, Massimo Longo

Keywords:

Nanowire, Non-Volatile Memory (NVM), Phase Change, SThM, Thermal Conductivity

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