Possibility of Reconstruction of Concentration Profile of Point Defects in Crystals by the Method of X-Ray Interference Diffractometry

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Periodical:

Defect and Diffusion Forum (Volumes 103-105)

Edited by:

Nickolay T. Bagraev

Pages:

491-496

Citation:

T.E. Goureev et al., "Possibility of Reconstruction of Concentration Profile of Point Defects in Crystals by the Method of X-Ray Interference Diffractometry", Defect and Diffusion Forum, Vols. 103-105, pp. 491-496, 1993

Online since:

January 1993

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$38.00

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