Characterization of the Defect Structure in Molecular Organic Crystals Using Ultrasonic Measurements
p.1
p.1
Theoretical Description of RED: From Dynamics of Defects to Rules for Phase Formation
p.14
p.14
Point Defect Behaviour Resulting from Dopant Diffusions in Silicon
p.48
p.48
Defects Below Mask Edges in Silicon Induced by Amorphizing Implantations
p.103
p.103
Transmission Electron Microscopy Study of the Microstructure of a GaN Film Grown on Sapphire by Organometallic Vapor Phase Expitaxy
p.122
p.122
Acceptor Impurities in Silicion Carbide: Electron Paramagnetic Resonance and Optically Detected Magnetic Resonance Studies
p.129
p.129
Hydrogen Diffusion Coefficient Dependencies on Hydrogen Contents in PdAg Alloys
p.161
p.161
Effect of Crystal Defects in FeNiC Alloys on Subsequent Martensitic Transformation
p.165
p.165
Characterization of the Defect Structure in Molecular Organic Crystals Using Ultrasonic Measurements
Abstract:
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Periodical:
Defect and Diffusion Forum (Volumes 148-149)
Pages:
1-13
Citation:
Online since:
March 1997
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© 1997 Trans Tech Publications Ltd. All Rights Reserved
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