Defect-Induced Transition at the Surface of Chalcopyrite Semiconductors
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a.767
Anelastic Spectroscopy as a Probe for Defects in Semiconductors
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a.768
Investigation of Electrically Active Defects in Semiconductor Structures
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a.769
Grating Spectroscopy for Defect Analysis of Semiconductor Surfaces
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a.770
Instability of a System of Primary Defects under Cascade Damage
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a.771
Self-Annealing during Ion Implantation
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a.772
Structural Defects in Superlattices
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a.773
Interstitials Introduced by Nitridation of AIII–BV Semiconductor Surfaces
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a.774
Effects of Nanoclusters and {113} Defects on Transient Enhanced Diffusion
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a.775
Instability of a System of Primary Defects under Cascade Damage
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