Paper Title:
Diffusion of 6Li in Tantalum and Tungsten Studied by the Neutron Depth Profiling Technique
  Abstract

Diffusion of 6Li in the refractory metals Ta and W has been studied using the nondestructive neutron depth profiling technique. The preliminary results point out the complex behavior of 6Li atoms in W and Ta. The experiment showed that the Fickian diffusion is affected by the presence of traps and radiation defects in the sample surface layer. Further experiments and computer simulations of the diffusion process are in progress.

  Info
Periodical
Defect and Diffusion Forum (Volumes 237-240)
Edited by
M. Danielewski, R. Filipek, R. Kozubski, W. Kucza, P. Zieba, Z. Zurek
Pages
485-490
DOI
10.4028/www.scientific.net/DDF.237-240.485
Citation
J. Vacik, U. Köster, V. Hnatowicz, J. Cervena, G. Pasold, "Diffusion of 6Li in Tantalum and Tungsten Studied by the Neutron Depth Profiling Technique", Defect and Diffusion Forum, Vols. 237-240, pp. 485-490, 2005
Online since
April 2005
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$35.00
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