Diffusion of 6Li in Tantalum and Tungsten Studied by the Neutron Depth Profiling Technique

Abstract:

Article Preview

Diffusion of 6Li in the refractory metals Ta and W has been studied using the nondestructive neutron depth profiling technique. The preliminary results point out the complex behavior of 6Li atoms in W and Ta. The experiment showed that the Fickian diffusion is affected by the presence of traps and radiation defects in the sample surface layer. Further experiments and computer simulations of the diffusion process are in progress.

Info:

Periodical:

Defect and Diffusion Forum (Volumes 237-240)

Edited by:

M. Danielewski, R. Filipek, R. Kozubski, W. Kucza, P. Zieba, Z. Zurek

Pages:

485-490

DOI:

10.4028/www.scientific.net/DDF.237-240.485

Citation:

J. Vacik et al., "Diffusion of 6Li in Tantalum and Tungsten Studied by the Neutron Depth Profiling Technique", Defect and Diffusion Forum, Vols. 237-240, pp. 485-490, 2005

Online since:

April 2005

Export:

Price:

$35.00

In order to see related information, you need to Login.

In order to see related information, you need to Login.