p.609
p.615
p.623
p.633
p.641
p.649
p.657
p.665
p.673
Grain Boundary Diffusion in Recrystallizing Nanocrystalline Materials
Abstract:
A model that considers diffusion in nanocrystalline materials undergoing recrystallization was developed. Application of this model enabled us deriving 63Ni radiotracer diffusion coefficients along the grain boundaries in ultrafine grain copper produced by equal channel angular pressing from the experimentally measured radiotracer penetration profiles.
Info:
Periodical:
Pages:
641-648
Citation:
Online since:
April 2009
Authors:
Price:
Сopyright:
© 2009 Trans Tech Publications Ltd. All Rights Reserved
Share:
Citation: