Grain Boundary Diffusion in Recrystallizing Nanocrystalline Materials
A model that considers diffusion in nanocrystalline materials undergoing recrystallization was developed. Application of this model enabled us deriving 63Ni radiotracer diffusion coefficients along the grain boundaries in ultrafine grain copper produced by equal channel angular pressing from the experimentally measured radiotracer penetration profiles.
A. Agüero, J.M. Albella, M.P. Hierro, J. Phillibert and F.J. Pérez Trujillo
L. M. Klinger et al., "Grain Boundary Diffusion in Recrystallizing Nanocrystalline Materials", Defect and Diffusion Forum, Vols. 289-292, pp. 641-648, 2009