Grain Boundary Diffusion in Recrystallizing Nanocrystalline Materials

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Abstract:

A model that considers diffusion in nanocrystalline materials undergoing recrystallization was developed. Application of this model enabled us deriving 63Ni radiotracer diffusion coefficients along the grain boundaries in ultrafine grain copper produced by equal channel angular pressing from the experimentally measured radiotracer penetration profiles.

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Periodical:

Defect and Diffusion Forum (Volumes 289-292)

Pages:

641-648

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Online since:

April 2009

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© 2009 Trans Tech Publications Ltd. All Rights Reserved

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