Grain Boundary Diffusion in Recrystallizing Nanocrystalline Materials

Abstract:

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A model that considers diffusion in nanocrystalline materials undergoing recrystallization was developed. Application of this model enabled us deriving 63Ni radiotracer diffusion coefficients along the grain boundaries in ultrafine grain copper produced by equal channel angular pressing from the experimentally measured radiotracer penetration profiles.

Info:

Periodical:

Defect and Diffusion Forum (Volumes 289-292)

Edited by:

A. Agüero, J.M. Albella, M.P. Hierro, J. Phillibert and F.J. Pérez Trujillo

Pages:

641-648

DOI:

10.4028/www.scientific.net/DDF.289-292.641

Citation:

L. M. Klinger et al., "Grain Boundary Diffusion in Recrystallizing Nanocrystalline Materials", Defect and Diffusion Forum, Vols. 289-292, pp. 641-648, 2009

Online since:

April 2009

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Price:

$35.00

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