High Resolution Transmission Electron Microscopy of Grain Boundaries

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Periodical:

Edited by:

D. Gupta, A.D. Romig and M.A. Dayananda

Pages:

151-166

DOI:

10.4028/www.scientific.net/DDF.59.151

Citation:

W. Krakow "High Resolution Transmission Electron Microscopy of Grain Boundaries", Defect and Diffusion Forum, Vol. 59, pp. 151-166, 1988

Online since:

January 1991

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$35.00

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