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Paper Titles
Diffusion Barriers - For Thin Film Metallizations
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High Resolution Transmission Electron Microscopy of Grain Boundaries
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Tunneling Microscopy of Surface Diffusion
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Characterization of Interfacial Chemistry by Analytical Electron Microscopy
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High Resolution Transmission Electron Microscopy of Grain Boundaries

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Periodical:

Defect and Diffusion Forum (Volume 59)

Pages:

151-166

DOI:

https://doi.org/10.4028/www.scientific.net/DDF.59.151

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Online since:

January 1988

Authors:

William Krakow

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© 1988 Trans Tech Publications Ltd. All Rights Reserved

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