Paper Titles
Preface
History and People of Solid-State Diffusion – An Overview
p.1
Techniques of Tracer Diffusion Measurements in Metals, Alloys and Compounds
p.31
Fundamental Core Effects in Transition Metal High-Entropy Alloys: “High-Entropy” and “Sluggish Diffusion” Effects
p.75
Vacancy-Mediated Diffusion and Diffusion-Controlled Processes in Ordered Binary Intermetallics by Kinetic Monte Carlo Simulations
p.95
Kinetic Monte Carlo Simulations for Solid State Ionics: Case Studies with the MOCASSIN Program
p.117
Kinetics and Thermodynamics of Fe-X (X= Al, Cr, Mn, Ti, B, and C) Melts under High Pressure
p.143
Novel Interdiffusion Analysis in Multicomponent Alloys - Part 1: Application to Ternary Alloys
p.161
Novel Interdiffusion Analysis in Multicomponent Alloys - Part 2: Application to Quaternary, Quinary and Higher Alloys
p.179

Techniques of Tracer Diffusion Measurements in Metals, Alloys and Compounds

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Abstract:

Tracer diffusion is one of most reliable techniques for providing basic kinetic data in solids. In the present review, selected direct methods, in particular the radiotracer measurements as a superior technique due to its high sensitivity, Secondary-Ion-Mass-Spectroscopy (SIMS) profiling, X-Ray Diffraction measurements and Rutherford Backscattering Spectrometry are presented and discussed. Special attention is put on the radiotracer technique describing the currently used sectioning techniques in detail with a focus on the experimental applications and complications. The relevant experimental results are exemplary shown. Furthermore, the most recent developments and advances related to the combined tracer/inter-diffusion measurements are highlighted. It is shown that this approach offers possibilities to provide the concentration-dependent tracer diffusion coefficients of the constituting elements in multi-component alloys in high-throughput experiments. Possibilities of estimating the tracer diffusion coefficients following different types of diffusion couple methods in binary and multicomponent systems are briefly introduced. Finally, specificity of SIMS analysis of diffusion in fine-grained materials are carefully analyzed. If applicable, a direct comparison of the results obtained by different techniques is given.

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Diffusion Foundations (Volume 29)

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31-73

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https://doi.org/10.4028/www.scientific.net/DF.29.31

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April 2021

Authors:

Daniel Gärtner, Lisa Belkacemi, Vladimir A. Esin, François Jomard, Andrey A. Fedotov, Juliana Schell, Julia V. Osinskaya, Alexander V. Pokoev, Cécilie Duhamel, Aloke Paul, Sergiy V. Divinski*

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Experimental Techniques, Multi-Component Alloys, Point Defects, Pure Metals, SIMS, Tracer Diffusion, XRD

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