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HomeKey Engineering MaterialsKey Engineering Materials Vols. 169-170Evaluation of Single Grain Boundaries in...

Evaluation of Single Grain Boundaries in ZnO:Rare-Earth Varistor by Photo-ICTS

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Electroceramics in Japan II

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Periodical:

Key Engineering Materials (Volumes 169-170)

Pages:

105-108

DOI:

https://doi.org/10.4028/www.scientific.net/KEM.169-170.105

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Online since:

June 1999

Authors:

A. Tanaka, K. Mukae

Keywords:

Interface States (or Traps), Optical Cross Section, Photo-ICTS, Varistors

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© 1999 Trans Tech Publications Ltd. All Rights Reserved

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