Dislocation Structure and Activated Slip Systems in β-Silicon Nitride during High Temperature Deformation

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Periodical:

Key Engineering Materials (Volumes 171-174)

Edited by:

T. Sakuma, K. Yagi

Pages:

825-832

DOI:

10.4028/www.scientific.net/KEM.171-174.825

Citation:

K. Kawahara et al., "Dislocation Structure and Activated Slip Systems in β-Silicon Nitride during High Temperature Deformation", Key Engineering Materials, Vols. 171-174, pp. 825-832, 2000

Online since:

October 1999

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$35.00

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