Paper Titles

Yttrium in Polycrystalline α-Alumina
p.793

Slip Systems in Erbia Single Crystals
p.801

A Critical Factor to Determine the High-Temperature Creep Resistance in Cation-Doped Polycrystalline Al₂O₃
p.809

Compressive Creep and Stress Relaxation Kinetics in a High Purity Silicon Nitride Ceramics in the 1400-1650 °C Range
p.817

Dislocation Structure and Activated Slip Systems in β-Silicon Nitride during High Temperature Deformation
p.825

Transmission Electron Microscope Observation of Creep Deformed Al₂O₃, SiC and Si₃N₄ Ceramics
p.833

Lifetime Prediction and Confirmation of Long Term Creep Resistance in Advanced Silicon Nitride Ceramics
p.841

Creep Behavior of a Fine-Grained Tetragonal Zirconia
p.847

High-Temperature Deformation in Unidirectionally Solidified Eutectic Al₂O₃-YAG Single Crystal
p.855

HomeKey Engineering MaterialsKey Engineering Materials Vols. 171-174Transmission Electron Microscope Observation of...

Transmission Electron Microscope Observation of Creep Deformed Al₂O₃, SiC and Si₃N₄ Ceramics

Article Preview

Abstract:

You might also be interested in these eBooks

Creep and Fracture of Engineering Materials and Structures

Info:

Periodical:

Key Engineering Materials (Volumes 171-174)

Pages:

833-840

DOI:

https://doi.org/10.4028/www.scientific.net/KEM.171-174.833

Citation:

Cite this paper

Online since:

October 1999

Authors:

Toyohiko Yano, A.Toshimitsu Yokobori Jr.

Keywords:

Al₂O₃, Creep, Silicon Carbide (SiC), TEM

Export:

RIS, BibTeX

Price:

Permissions CCC:

Request Permissions

Permissions PLS:

Request Permissions

Сopyright:

© 2000 Trans Tech Publications Ltd. All Rights Reserved

Share:

Citation: