Transmission Electron Microscope Observation of Creep Deformed Al2O3, SiC and Si3N4 Ceramics

Abstract:

Article Preview

Info:

Periodical:

Key Engineering Materials (Volumes 171-174)

Edited by:

T. Sakuma, K. Yagi

Pages:

833-840

DOI:

10.4028/www.scientific.net/KEM.171-174.833

Citation:

T. Yano and A.T. Yokobori Jr., "Transmission Electron Microscope Observation of Creep Deformed Al2O3, SiC and Si3N4 Ceramics", Key Engineering Materials, Vols. 171-174, pp. 833-840, 2000

Online since:

October 1999

Export:

Price:

$35.00

In order to see related information, you need to Login.