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HomeKey Engineering MaterialsKey Engineering Materials Vols. 181-182Characterization of BaTi0.91(Hf0.5,Zr0.5)0.09O3...

Characterization of BaTi_0.91(Hf_0.5,Zr_0.5)_0.09O₃ Films Fabricated by Laser Ablation Technique

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Electroceramics in Japan III

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Periodical:

Key Engineering Materials (Volumes 181-182)

Pages:

89-92

DOI:

https://doi.org/10.4028/www.scientific.net/KEM.181-182.89

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Online since:

May 2000

Authors:

Hirofumi Kakemoto, S. Fujita, Y. Masuda

Keywords:

BaTi_0.91(Hf_0.5,Zr_0.5)_0.09O₃, D-E Hysteresis Loop, Dielectric Constant, Laser Ablation, Leakage Current Density

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© 2000 Trans Tech Publications Ltd. All Rights Reserved

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