Fracture from Knoop Indentation-Induced Flaws in Sintered Silicon Carbide and Hot-Pressed Silicon Nitride

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Periodical:

Key Engineering Materials (Volumes 224-226)

Edited by:

Jianghong Gong and Wei Pan

Pages:

765-770

DOI:

10.4028/www.scientific.net/KEM.224-226.765

Citation:

J. H. Gong and Z. D. Guan, "Fracture from Knoop Indentation-Induced Flaws in Sintered Silicon Carbide and Hot-Pressed Silicon Nitride", Key Engineering Materials, Vols. 224-226, pp. 765-770, 2002

Online since:

June 2002

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$35.00

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