Structural and Electrical Properties of (Bi,La)4Ti3O12 Thin Films with a Bi2O3 Top-Layer Prepared by a Chemical Solution Deposition Method

Dinghua Bao; Naoki Wakiya; Kazuo Shinozaki; Nobuyasu Mizutani

doi:10.4028/www.scientific.net/KEM.248.45

Paper Titles

Reaction Mechanism of Perovskite KNbO₃ in Aqueous Solution
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Some Properties of the GETA Shape(2 legs) Piezoelectric Motor
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Finite Element Method Analysis of Piezoelectric Transformer
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Effects of SiO₂-Based Additives on Bi-Based Layer-Structured Ferroelectrics
p.41

Structural and Electrical Properties of (Bi,La)₄Ti₃O₁₂ Thin Films with a Bi₂O₃ Top-Layer Prepared by a Chemical Solution Deposition Method
p.45

Orientation Control of Bi-La-Ti-O Thin Films Derived by Chemical Solution Deposition Method
p.49

Effect of Source Supply Method on Microstructure Development in PZT Thin Films by Pulsed Metalorganic Chemical Vapor Deposition
p.53

Effect of Starting Materials on Deposition Behavior, Crystal Structure and Electrical Properties of MOCVD-PZT Films
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Fabrication of Epitaxially Grown PLZT Patterned Microstructures Using a Sol-Gel Method
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Structural and Electrical Properties of (Bi,La)₄Ti₃O₁₂ Thin Films with a Bi₂O₃ Top-Layer Prepared by a Chemical Solution Deposition Method

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Periodical:

Key Engineering Materials (Volume 248)

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45-48

DOI:

https://doi.org/10.4028/www.scientific.net/KEM.248.45

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Online since:

August 2003

Authors:

Dinghua Bao, Naoki Wakiya, Kazuo Shinozaki, Nobuyasu Mizutani

Keywords:

BLT, CSD, Fatigue, Ferroelectric, Retention, Thin Film

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References

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