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HomeKey Engineering MaterialsKey Engineering Materials Vols. 257-258Analysis of a Surface Encoder in Wave Optics

Analysis of a Surface Encoder in Wave Optics

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Advances in Abrasive Technology VI

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Periodical:

Key Engineering Materials (Volumes 257-258)

Pages:

219-224

DOI:

https://doi.org/10.4028/www.scientific.net/KEM.257-258.219

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Online since:

February 2004

Authors:

Yutaka Watanabe, W. Gao, Hideki Shimizu, S. Kiyono

Keywords:

Machine Tool Carriage, Position Measurement, Surface Encoder, Wave Optics

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© 2004 Trans Tech Publications Ltd. All Rights Reserved

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[1] H. Kunzmann, T. Pfeifer and J. Flugge: Annals of the CIRP, Vol. 42 (1993), p.753.

[2] C.R. Steinmetz: Precision Engineering, Vol. 12 (1990), p.12.

[3] A. Teimel: Precision Engineering, Vol. 14 (1992), p.147.

[4] S. Kiyono, P. Cai and W. Gao: JSME International Journal, Series C, Vol. 42 (1999), p.44.

[5] W. Gao, S. Dejima, Y. Shimizu and S. Kiyono: Annals of CIRP, Vol. 52 (2003), p.435.

[6] A.E. Ennos and M.S. Virdee: Precision Engineering, Vol. 4 (1982), p.5.

[7] A.E. Ennos and M.S. Virdee: Industrial Application of Laser Technology – SPIE, Vol. 398 (1983), p.252.

[8] W. Gao, S. Kiyono and T. Nomura: Precision Engineering, Vol. 19 (1996), p.37.

[9] W. Gao and S. Kiyono: Optical Engineering, Vol. 36 (1997), p.3360.

[10] W. Gao, S. Kiyono and E. Satoh: Annals of CIRP, Vol. 52 (2002), p.447.

[11] W. Gao, P.S. Huang, T. Yamada and S. Kiyono: Precision Engineering, Vol. 26 (2002), p.396.

[12] H. Dammann and K. Görtler: Optics Communications, Vol. 3 (1971), p.312.

[13] S.J. Walker and J. Jahns: Journal of the Optical Society of America, Part A, Vol. 7 (1990), p.1509.

[14] R.L. Morrision: Journal of the Optical Society of America, Part A, Vol. 9 (1992), p.464.

[15] K. Kataoka and Y. Shibayama: Applied Optics, Vol. 36 (1997), p.853. Intensity Intensity Intensity Displacement �x µm Encoder output Sx Calculated output Actual output Position in the X-direction µm Position in the X-direction µm Position in the X-direction µm Fig. 11 Comparison results of encoder output

DOI: 10.1364/oe.489258