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HomeKey Engineering MaterialsKey Engineering Materials Vols. 270-273Oblique View Cone Beam Tomography for Inspection...

Oblique View Cone Beam Tomography for Inspection of Flat-Shape Objects

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Advances in Nondestructive Evaluation

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Periodical:

Key Engineering Materials (Volumes 270-273)

Pages:

1135-1142

DOI:

https://doi.org/10.4028/www.scientific.net/KEM.270-273.1135

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Cite this paper

Online since:

August 2004

Authors:

Masaki Misawa, Ion Tiseanu, Ryusuke Hirashima, Kazuto Koizumi, Yasushi Ikeda

Keywords:

BGA, Cone Beam Tomography, Flat Object, Microstructure, Print Circuit Board

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© 2004 Trans Tech Publications Ltd. All Rights Reserved

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[1] Y. Ikeda, Y. Mizuta, R. Hirashima: A New U-centric Radioscopy System for BGA and LSI, Proc. 15th World Conference on Nondestructive Testing, CD-ROM, Roma, Italy (2000-10).

[2] A. -H. Benouali, L. Froyen, M. Wevers: X-ray Tomography in Materials Science, Chapter 10, pp.139-153, Hermes Science Publications, Paris (2000).

[3] S. Gondrom, S. Schropfer: Digital computed laminography and tomosynthesis-functional principles and industrial applications, Proc. Computerized Tomography for Industrial Applications and Image Processing in Radiology, BB67-CD, paper 11, pp.75-81.

[4] L.A. Feldkamp, L.C. Davis, and J.W. Kress: Practical cone beam algorithm, J. Opt. Soc. Ame. A, Vol. 1 No. 6 (1984), pp.612-619.

[5] Z. Yang and R. Maeda, Ultrasonic micro-degassing device, IEEE MEMS 2001 (2001) pp.471-474. (a)NCBT (b)OVCBT (c)LMNG Fig. 10. Visualization of a MEMS sample as a low-contrast media.

DOI: 10.1109/memsys.2001.906581