Study of Residual Stress Relaxation Using X-Ray Diffraction

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Periodical:

Key Engineering Materials (Volumes 274-276)

Edited by:

W.P. Shen and J.Q. Xu

Pages:

871-876

DOI:

10.4028/www.scientific.net/KEM.274-276.871

Citation:

W. C. D. Cheong et al., "Study of Residual Stress Relaxation Using X-Ray Diffraction ", Key Engineering Materials, Vols. 274-276, pp. 871-876, 2004

Online since:

October 2004

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$35.00

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