[1]
T. Maeder, P. Muralt, L. Sagalowicz, K.G. Brooks, I.M. Reaney, R. Klissurka, Y. Huang, L. Bursill and N. Setter: J. Mater. Res. Vol. 9 (1994), p.2540.
Google Scholar
[2]
J. Ishida, T. Yamada, A. Sawabe, K. Okuwada and K. Saito: Appl. Phys. Lett. Vol. 80 (2002), p.467.
Google Scholar
[3]
V.Y. Shur, E.B. Blankova, A.L. Subbotin, E. A. Borisova, D. V. Pelegov and S. Hoffmann: J. Euro. Ceram. Soc. Vol. 19 (1999), p.1391.
Google Scholar
[4]
J. Hector, N. Floquet, J.C. Niepce, P. Gaucher and J.P. Ganne: Microelectron. Eng. Vol. 29 (1995), p.285.
Google Scholar
[5]
S.Y. Chen: Mater. Chem. Phys. Vol. 45 (1996), p.159.
Google Scholar
[6]
T. Maeder, P. Muralt and L. Sagalowicz: Thin Solid Films Vol. 345 (1999), p.300.
Google Scholar