p.35
p.39
p.45
p.49
p.53
p.57
p.61
p.65
p.69
In Situ Simultaneous Observation of Phase Transition and Electrical Properties of Pb(Zr,Ti)O3 Thin Film by High Temperature XRD and Electrical Measurement Apparatus
Abstract:
Pb(Zr0.05Ti0.95)O3/(La,Sr)CoO3 thin films were prepared by pulsed laser deposition (PLD) on SrTiO3(001) substrates. Phase transition behavior of Pb(Zr0.05Ti0.95)O3 (PZT) was investigated using high temperature X-ray diffraction (HT-XRD) and high-temperature electrical measurement. The phase transition temperature of PZT thin film is larger than bulk one. In 100 and 200nm-thickness epitaxial PZT thin films, the phase transition temperatures obtained from X-ray diffraction measurement and electrical property measurement are in good agreement.
Info:
Periodical:
Pages:
53-56
Citation:
Online since:
September 2006
Keywords:
Price:
Сopyright:
© 2006 Trans Tech Publications Ltd. All Rights Reserved
Share:
Citation: