Macro-Residual Stress in 304 Stainless Steel Coated with ZrO2-CeO2 Thin Films by Sol-Gel Process

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Abstract:

X-ray diffraction (XRD) method to measure the residual stress existing in the metal substrate surface layer was introduced and the sol-gel ZrO2-CeO2 thin film was successfully prepared on SUS304 stainless steel substrate by dip-coating process. The macro residual stress existing in metal substrate was analyzed by XRD. It turns out that the compressive stress existing in the metal substrate surface layer increases with the increase of heat-treated temperature. Based on the above study, colored stainless steels of high quality were prepared by sol-gel process.

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Key Engineering Materials (Volumes 336-338)

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2649-2651

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April 2007

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© 2007 Trans Tech Publications Ltd. All Rights Reserved

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[1] I. Strawbridge and P.F. James: J. Non-Cryst. Solids Vol. 82 (1986), p.366.

Google Scholar

[2] K. Izumi, H. Tanaka, M. Murakami, et al.: J. Non-Cryst. Solids Vol. 121 (1990), p.344.

Google Scholar

[3] K. Kato: J. Mater. Sci. Vol 28 (1993), p.4033.

Google Scholar

[4] J. W. Lee, C. W. Won, B. S. Chun and H. Y. Sohn: J. Mater. Res. Vol. 8 (1993), p.3153.

Google Scholar

[5] K. Miyazawa, K. Suzuki and M. Y. Wey: J. Am. Ceram. Soc. Vol. 78 (1995), p.347.

Google Scholar

[6] M. Atik, C. R. Kha, P. DE Limaneto, et al.: J. Mater. Sci. Lett. Vol. 14 (1995), p.178.

Google Scholar

[7] M. Atik, P. De Limaneto, M. A. Aegerter and L. A. Avaca: J. Appl. Electrochem. Vol. 25 (1995), p.142.

Google Scholar

[8] E. Szalkowska, J. Gluszek, J. Masalski, and W. Tylus: J. Mater. Sci. Lett. Vol. 20 (2001), p.495.

DOI: 10.1023/a:1010955811871

Google Scholar

[9] H. Li, K. Liang, L. Mei, S. Gu, and S. Wang: J. Mater. Sci. Lett. Vol. 20 (2001), p.1081.

Google Scholar

[10] X. Yu, Y. Zuo, H. Ma, et al.: Key Eng. Mater. Vol. 280-283 (2005), p.815.

Google Scholar

[11] Y. Wang: Technological Foundation of X-ray Diffraction (Atomic Energy Publishing House, 1987).

Google Scholar

[12] L. D. Landau and B. G. Levich: Acta physiochim, USSR. Vol. 17 (1942), p.42.

Google Scholar