Preparation and Characterization of Relaxor-Based Ferroelectric Thick Films with Single Perovskite Structure

Abstract:

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Lead magnesium niobate-lead titanate (0.8Pb(Mg1/3Nb2/3)O3-0.2PbTiO3, PMN-PT) thick films in the thickness range about 75 μm have been successfully fabricated on Au-coated Al2O3 substrates by electrophoretic deposition (EPD). Non-aqueous colloidal suspensions suitable for EPD were prepared by mixing ultrasonically PMN-PT particles in ethanol with pH=6.0. The effect of EPD process parameters such as deposition voltage, deposition time and the specific deposition mass of PMN-PT particles were investigated. The EPD parameters were optimized in order to obtain crack-free, high-quality uniform ceramic films. The deposited pyrochlore-free PMN-PT thick films were sintered at 1000oC for 30 min, and the phase evolvement and the microstructure of the film were characterized by X-ray diffraction and scanning electron microscope.

Info:

Periodical:

Key Engineering Materials (Volumes 368-372)

Edited by:

Wei Pan and Jianghong Gong

Pages:

24-26

DOI:

10.4028/www.scientific.net/KEM.368-372.24

Citation:

H. Q. Fan et al., "Preparation and Characterization of Relaxor-Based Ferroelectric Thick Films with Single Perovskite Structure", Key Engineering Materials, Vols. 368-372, pp. 24-26, 2008

Online since:

February 2008

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$35.00

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