Microstructures and Microwave Dielectric Properties on Annealed Al2O3-TiO2 Composite Ceramics

Abstract:

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The large negative temperature coefficient of resonant frequency ( τ f ) of Al2O3 is a problem for applicable microwave/millimeter wave dielectrics. A Previous study reported that the τ f was improved by sintering with TiO2 and then annealing, where the annealing decompose the secondary phase of Al2TiO5. This study investigated the hold time of annealing. The Quality factor (Qf ) value decreased when the sample was annealed at 1100°C for 2hrs. While Al2TiO5 was not detected by X-ray powder diffraction, it was located around TiO2 by scanning transmission electron microscopy equipped with energy dispersive X-ray spectroscopy. It should be considered that the degradation of the Qf was caused by the existence of noncrystalline Al2TiO5 and new boundaries between noncrystalline Al2TiO5 and TiO2.

Info:

Periodical:

Edited by:

Kazumi Kato, Tadashi Takenaka, Masasuke Takata and Kazuo Shinozaki

Pages:

251-254

DOI:

10.4028/www.scientific.net/KEM.388.251

Citation:

Y. Miyauchi et al., "Microstructures and Microwave Dielectric Properties on Annealed Al2O3-TiO2 Composite Ceramics", Key Engineering Materials, Vol. 388, pp. 251-254, 2009

Online since:

September 2008

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Price:

$35.00

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