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HomeKey Engineering MaterialsKey Engineering Materials Vol. 403Atomic Resolution and In Situ Characterization of...

Atomic Resolution and In Situ Characterization of Structural Ceramics

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Periodical:

Key Engineering Materials (Volume 403)

Pages:

43-44

DOI:

https://doi.org/10.4028/www.scientific.net/KEM.403.43

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Online since:

December 2008

Authors:

Yuichi Ikuhara

Keywords:

Si₃N₄, Al₂O₃, Fracture, Gallium Nitride (GaN), Grain Boundary, HREM, STEM

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© 2009 Trans Tech Publications Ltd. All Rights Reserved

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[1] Yuichi Ikuhara, J. Ceram. Soc. Jpn., 110, 139-145 (2002).

[2] C. Iwamoto, X.Q. Shen, H. Okumura, H. Matsuhata and Y. Ikuhara, Appl. Phys. Lett., 79, 3941 (2001).

[3] J.P. Buban, K. Matusnaga, J. Chen, N. Shibata, W.Y. Ching, T. Yamamoto, Y. Ikuhara, Science 311 212 (2006).

[4] H. Yoshida, T. Yamamoto, Y. Ikuhara and T. Sakuma, Phil. Mag.A., 82, 511(2002).

[5] S. Ii, C. Iwamoto, K. Matsunaga, T. Yamamoto and Y. Ikuhara, J. Electo. Micros., 53 (2), 121 (2004) Fig. 2. HRTEM micrograph of the crack walls in Si3N4, indicating that the crack propagated toward.

[1120] and the cleavage plane was parallel to (1100) plane.

[5] .