AFM Study of Typical Fracture Surfaces in Room-Temperature Fracture of Sapphire

José M. López-Cepero; Sheldon M. Wiederhorn; António Ramirez de Arellano-López; Julian Martínez-Fernández

doi:10.4028/www.scientific.net/KEM.409.113

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AFM Study of Typical Fracture Surfaces in Room-Temperature Fracture of Sapphire

Abstract:

Rhombohedral r-plane fracture surfaces in sapphire are analyzed by optical microscopy and by atomic force microscopy. Features of special interest include steps, lines and angles on the surface that appear to have crystallographic origins. A classification and description of these features is given over a scale ranging from hundreds of micrometers to tens of nanometers. Preferential directions in the surface are identified and related to the crystalline orientation of the sample; an attempt is made to identify the underlying phenomenology behind the appearance of each kind of feature.

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Periodical:

Key Engineering Materials (Volume 409)

Pages:

113-122

DOI:

https://doi.org/10.4028/www.scientific.net/KEM.409.113

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Online since:

March 2009

Authors:

José M. López-Cepero, Sheldon M. Wiederhorn, António Ramirez de Arellano-López, Julian Martínez-Fernández

Keywords:

Atomic Force Microscope (AFM), Fractography, Rhombohedral Plane, Sapphire

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