Prototype of Atomic Force Microscope with High Resolution Optical Microscope for Observing Magnetic Nanodot Arrays

Tao Jin; Ryosuke Takahashi; Hui Zhang; You Yin; Sumio Hosaka

doi:10.4028/www.scientific.net/KEM.643.185

Paper Titles

Phase Noise Measurement and Testing with Delta-Sigma TDC
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Frequency Bandwidth Adjustment by Precision Post-Processing for a 0.78–0.95 THz Band SIS Mixer
p.157

Frictional Characteristics Measurement of a Ceramic Aerostatic Linear Bearing
p.167

Impact Response Measurement of Contact Lenses
p.173

Surface Measurement by Digital Holography with New Unwrapping Method
p.179

Prototype of Atomic Force Microscope with High Resolution Optical Microscope for Observing Magnetic Nanodot Arrays
p.185

Computational Analysis of Heavy Ion-DNA Interaction Using Molecular Dynamics Method
p.193

Simulation Study on Indoor Pollen Removal with Variable Exhaust Angle of an Air Purifier
p.199

Feasibility of Ceiling-Mounted Assist Device of Air-Purifier for Removal of Airborne Allergic Pollen Grains
p.205

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Prototype of Atomic Force Microscope with High Resolution Optical Microscope for Observing Magnetic Nanodot Arrays

Abstract:

This paper is dedicated to develop an atomic force microscope (AFM) system cou-pled with a high resolution optical microscope (OM), which serves to observe AFM image from a desired micro-area. The system employs through-the-lens optical path for detecting atomic force based on optical lever. By switching the objective lenses from low to high magni cation, a micro-area for obtaining AFM image can be easily found. AFM images of magnetic nanodotarrays with 300 nm and 150 nm pitches are obtained from two local micro-areas using the system. The results demonstrate the proposed prototype has the su cient function to nd out a micro-area for obtaining AFM image.