Investigation on the Effects of SiO2 Content on the NTC Thermistor Properties of Ce1.2(1-x)Mn1-xSix System

M.Z. Hu; Yong De Hao; Yan Yan Deng

doi:10.4028/www.scientific.net/KEM.768.92

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HomeKey Engineering MaterialsKey Engineering Materials Vol. 768Investigation on the Effects of SiO2 Content on...

Investigation on the Effects of SiO₂ Content on the NTC Thermistor Properties of Ce_1.2(1_-x₎Mn_1-xSi_x System

Abstract:

Ce_1.2(1_-_x₎Mn_1-_xSi_x(x=0.1,0.2.0.3,0.4) NTC thermistor materials were prepared by the traditional solid-state reaction method. The effects of SiO₂ content on the microstructure and electric properties of prepared materials are investigated through XRD, SEM, XPS and several instruments for electrical properties characterization. The results indicate that the average grain size increases with the increasing SiO₂ content. The resistivity and materials constant B value exhibit opposite change laws. The minimum room resistivity of 7.18×10⁵Ω·cm and the maximum characteristic parameter B value of 5507K are obtained when x=0.2. And when x=0.1 the aging factor η is 0.34% and it decreases as the CeO₂ content increases.

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Periodical:

Key Engineering Materials (Volume 768)

Pages:

92-96

DOI:

https://doi.org/10.4028/www.scientific.net/KEM.768.92

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Online since:

April 2018

Authors:

M.Z. Hu, Yong De Hao*, Yan Yan Deng

Keywords:

Aging, Electrical Properties, Negative Temperature Coefficient, Resistance, SiO₂ Content

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