Dependence of Lattice Distortion and Dielectric Response of Zinc Aluminate on Milling Frequency

Abstract:

Zinc aluminate (ZnAl₂O₄) samples were prepared using nanomilling based solid state reaction method for several potential applications. Effect of milling frequency on structural and dielectric behavior of ZnAl₂O₄ has been explored systemically. Investigation of crystal structure reveals that change in lattice parameter by milling does not alter the cubic lattice of ZnAl₂O₄. This milling frequency at the nanosize resulted in a gradual decrease in the particle size, which can be attributed to the inhomogeneous defects. Grain size in nanometers has been calculated by XRD using Debye-Scherrer formula. Dielectric measurements performed in the range of 20Hz-20MHz confirms the Maxwell –Wagner two layer model which is consistent with the Koop’s theory. High value of ac conductivity indicates that milling blocked the ionic transport. As a result of Nyquist plots, a single semicircle was obtained which indicated the leading role of grain (bulk). The variation in the semicircle radii for different samples is due to the influence of milling frequency.

• Periodical: Key Engineering Materials (Volume 778)
• Pages: 217-224
• DOI: https://doi.org/10.4028/www.scientific.net/KEM.778.217
• Online since: September 2018
• Authors: Hadia Noor Noor*, Saira Riaz, Malik Maryyam Iram, Amna Siddiqi, Shahzad Naseem
• Keywords: Dielectric Constant, Grain Size, Milling Frequency, Polarization, X-Ray Diffraction (XRD), ZnAl₂O₄

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