Subthreshold Radiation Damage in Silicon: Carbon Isotope Measurements on Cs-SiI-Cs Complexes

Abstract:

Article Preview

Info:

Periodical:

Materials Science Forum (Volumes 10-12)

Edited by:

H.J. von Bardeleben

Pages:

1099-1104

DOI:

10.4028/www.scientific.net/MSF.10-12.1099

Citation:

L. T. Canham and E. C. Lightowlers, "Subthreshold Radiation Damage in Silicon: Carbon Isotope Measurements on Cs-SiI-Cs Complexes", Materials Science Forum, Vols. 10-12, pp. 1099-1104, 1986

Online since:

January 1986

Export:

Price:

$35.00

In order to see related information, you need to Login.