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Capacitance and Current Spectroscopy of Perpendicular Transport in Compensated GaAs-GaAlAs Superlattices
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Characterization of Electron Traps in GaAs-GaAlAs Superlattices
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Defect Generation in the Initial Stages of Epitaxial Growth of GaAs on Silicon by MBE
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Atomic Imaging of Surface Defects on Si
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Influence of Strain on Silicon Surface and Silicon Oxide Interface Reconstruction
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Deep Level at Semiconductor Surfaces
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Charged Defect States at Silicon Grain Boundaries
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HomeMaterials Science ForumMaterials Science Forum Vols. 10-12Defect Generation in the Initial Stages of...

Defect Generation in the Initial Stages of Epitaxial Growth of GaAs on Silicon by MBE

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Defects in Semiconductors 14

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Periodical:

Materials Science Forum (Volumes 10-12)

Pages:

205-210

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.10-12.205

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Online since:

January 1986

Authors:

F.A. Ponce, D.K. Biegelsen, J.C. Tramontana, A.J. Smith

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© 1986 Trans Tech Publications Ltd. All Rights Reserved

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