Paper Titles

Capacitance and Current Spectroscopy of Perpendicular Transport in Compensated GaAs-GaAlAs Superlattices
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Characterization of Electron Traps in GaAs-GaAlAs Superlattices
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Defect Generation in the Initial Stages of Epitaxial Growth of GaAs on Silicon by MBE
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Atomic Imaging of Surface Defects on Si
p.211

Influence of Strain on Silicon Surface and Silicon Oxide Interface Reconstruction
p.217

Deep Level at Semiconductor Surfaces
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Charged Defect States at Silicon Grain Boundaries
p.229

Bulk and Grain Boundary Defects in Polycrystalline ZnO
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The Role of Defect Production at Surface and Interface of CdHgTe and ZnHgTe
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HomeMaterials Science ForumMaterials Science Forum Vols. 10-12Influence of Strain on Silicon Surface and Silicon...

Influence of Strain on Silicon Surface and Silicon Oxide Interface Reconstruction

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Defects in Semiconductors 14

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Periodical:

Materials Science Forum (Volumes 10-12)

Pages:

217-222

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.10-12.217

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Online since:

January 1986

Authors:

A. Ourmazd, D.W. Taylor, J. Bevk, B.A. Davidson, Leonard C. Feldman, J.P. Mannaerts

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© 1986 Trans Tech Publications Ltd. All Rights Reserved

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