Influence of Strain on Silicon Surface and Silicon Oxide Interface Reconstruction
p.217
p.217
Deep Level at Semiconductor Surfaces
p.223
p.223
Charged Defect States at Silicon Grain Boundaries
p.229
p.229
Bulk and Grain Boundary Defects in Polycrystalline ZnO
p.235
p.235
The Role of Defect Production at Surface and Interface of CdHgTe and ZnHgTe
p.241
p.241
Electronic Structure of As and P Antisite Defects and Ga Vacancy in GaP and GaAs
p.247
p.247
EPR Spectra of AsGa Aggregates in GaAs
p.253
p.253
Endor-Investigation of the Ga Vacancy in GaP
p.259
p.259
Characterization of Vacancy Defects in As-Grown and Electron Irradiated GaAs by Positron Annihilation
p.265
p.265
The Role of Defect Production at Surface and Interface of CdHgTe and ZnHgTe
Abstract:
You might also be interested in these eBooks
Info:
Periodical:
Materials Science Forum (Volumes 10-12)
Pages:
241-246
Citation:
Online since:
January 1986
Price:
Сopyright:
© 1986 Trans Tech Publications Ltd. All Rights Reserved
Share:
Citation: