Diffusion Bonding Performance of Copper Target for 300mm Integrated Circuit

Abstract:

Ultra-pure copper sputtering target is a key material widely used in large-scale integrated circuits with 90-28 nm feature size. The copper target for 300 mm integrated circuit requires a reliable diffusion bonding between the ultra-pure copper target and the copper alloy backplate. The bonding ratio and bonding strength of diffusion bonding should reach over 99% and 80 MPa respectively. In this paper, the ascendant structure of electron beam welding united diffusion bonding with high quality was designed. The ultra-pure copper target and the C18000 copper alloy backplate were machined to coordinating size, meanwhile the backplate underwent surface treatment of toothed/smooth, ion cleaning, magnetron sputtering coating, then the combination of target and the backplate was proceeded electron beam welding and diffusion bonding. Metallographic microscope, scanning electron microscope (SEM), mechanical tensile machine, C-scan flaw detector were used to analyze the bonding properties including interface microstructure, bonding strength and bonding ratio. The results show that the bonding ratio of copper target was above 99%, and the bonding strength was up to 80-160 MPa.

• Periodical: Materials Science Forum (Volume 1035)
• Pages: 692-697
• DOI: https://doi.org/10.4028/www.scientific.net/MSF.1035.692
• Online since: June 2021
• Authors: Shan Shan Guo*, Yuan Yuan Jiang, Hao Zeng, Xiao Yong Wan, Yong Jun Li
• Keywords: Diffusion Bonding, Integrated Circuit, Ultra-Pure Copper Target

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