Characterisation of an SiO2/Si Interface with Slow Positrons

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Periodical:

Materials Science Forum (Volumes 105-110)

Edited by:

Zs. Kajcsos and Cs. Szeles

Pages:

1451-1454

DOI:

10.4028/www.scientific.net/MSF.105-110.1451

Citation:

D.L. Smith et al., "Characterisation of an SiO2/Si Interface with Slow Positrons", Materials Science Forum, Vols. 105-110, pp. 1451-1454, 1992

Online since:

January 1992

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$35.00

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