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HomeMaterials Science ForumMaterials Science Forum Vol. 1070Temporal Observation of Barkhausen Avalanche with...

Temporal Observation of Barkhausen Avalanche with Short-Range Interaction in Perpendicularly Magnetized Thin Film

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Abstract:

We present here a method for measuring the temporal Bakehausen scaling exponent in a two-dimensional thin film. The scaling exponent with long-range interaction is observed to be consistent with theoretical and experimental results. In addition, we demonstrate the characteristic exponent with short-range interaction. Our method contributes to the understanding of DW dynamics and helps to optimize spintronic devices.

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Periodical:

Materials Science Forum (Volume 1070)

Pages:

183-187

DOI:

https://doi.org/10.4028/p-672442

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Online since:

October 2022

Authors:

Tao Xing*, Nicolas Vernier, Xue Ying Zhang, You Guang zhang, Wei Sheng Zhao

Keywords:

Barkhausen Effect, Domain Wall, Magneto-Optical Kerr Effect, Perpendicular Magnetic Anisotropy, Short-Range Interaction

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© 2022 Trans Tech Publications Ltd. All Rights Reserved

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