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Surface Properties of the Mechanical Exfoliated MoS2 few Layers

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Abstract:

In this work, an investigation of the mechanically exfoliated MoS2 under the influence of heat treatment was carried out. Optical and atomic force microscopy techniques were applied to determine the number of layers. Resonant Raman investigation was performed, which clearly showed systematic layer-dependent spectral features. The surface morphology of MoS2 was investigated with the STM. Atomic-resolution images of MoS2 is were obtained. Three types of atomic defects were identified as substitutions of donor and acceptor atoms in the Mo atomic layer below the topmost sulfur layer.

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Periodical:

Materials Science Forum (Volume 1167)

Pages:

97-104

DOI:

https://doi.org/10.4028/p-ClC9tI

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Online since:

November 2025

Authors:

Bayarsaikhan Odontuya, Dugerjav Otgonbayar, Orgodolzangiat Erdenetuya, Ganbat Batdemberel, Erdene Ochir Gurbadam, Sereenen Jargalan, Gonchigsuren Munkhsaikhan*

Keywords:

AFM, Impurities, Layer Identification in 2D Materials, Layered Materials, MoS2, Resonant Raman Spectroscopy, STM, Surface Defects

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© 2025 Trans Tech Publications Ltd. All Rights Reserved

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