Differential Hall-Effect Spectroscopy of Rare-Earth Impurities (Ce, Er) in Silicon

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Periodical:

Materials Science Forum (Volumes 117-118)

Edited by:

Tsunemasa Taguchi

Pages:

279-284

DOI:

10.4028/www.scientific.net/MSF.117-118.279

Citation:

H. Nakayama et al., "Differential Hall-Effect Spectroscopy of Rare-Earth Impurities (Ce, Er) in Silicon", Materials Science Forum, Vols. 117-118, pp. 279-284, 1993

Online since:

January 1993

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$35.00

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