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HomeMaterials Science ForumMaterials Science Forum Vols. 117-118Differential Hall-Effect Spectroscopy of...

Differential Hall-Effect Spectroscopy of Rare-Earth Impurities (Ce, Er) in Silicon

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Shallow Impurities in Semiconductors V

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Periodical:

Materials Science Forum (Volumes 117-118)

Pages:

279-284

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.117-118.279

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Online since:

January 1993

Authors:

H. Nakayama, A. Matsuura, M. Kohno, Taneo Nishino

Keywords:

Hall-Effect, Rare-Earth-Metal, Silicon

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© 1993 Trans Tech Publications Ltd. All Rights Reserved

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