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HomeMaterials Science ForumMaterials Science Forum Vols. 126-128Determination of the Chemical Valence of Atoms at...

Determination of the Chemical Valence of Atoms at a Heterophase Interface by X-Ray Diffraction Measurements of Crystal Truncation Rod Intensity at an Atomic Absorption Edge

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Intergranular and Interphase Boundaries in Materials

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Periodical:

Materials Science Forum (Volumes 126-128)

Pages:

575-578

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.126-128.575

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Online since:

January 1993

Authors:

E.D. Specht, F.J. Walker

Keywords:

Al₂O₃, Cr₂O₃, Interface Structure, X-Ray Diffraction (XRD)

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© 1993 Trans Tech Publications Ltd. All Rights Reserved

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