Determination of the Chemical Valence of Atoms at a Heterophase Interface by X-Ray Diffraction Measurements of Crystal Truncation Rod Intensity at an Atomic Absorption Edge

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Periodical:

Materials Science Forum (Volumes 126-128)

Edited by:

Ph. Komninou and A. Rocher

Pages:

575-578

DOI:

10.4028/www.scientific.net/MSF.126-128.575

Citation:

E.D. Specht and F.J. Walker, "Determination of the Chemical Valence of Atoms at a Heterophase Interface by X-Ray Diffraction Measurements of Crystal Truncation Rod Intensity at an Atomic Absorption Edge", Materials Science Forum, Vols. 126-128, pp. 575-578, 1993

Online since:

January 1993

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$35.00

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