X-Ray Diffraction Examination of Structure and Stability of Amorphous Cu-W Thin Films

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Periodical:

Materials Science Forum (Volumes 133-136)

Edited by:

R. Delhez and E.J. Mittemeijer

Pages:

913-920

DOI:

10.4028/www.scientific.net/MSF.133-136.913

Citation:

B. Gržeta et al., "X-Ray Diffraction Examination of Structure and Stability of Amorphous Cu-W Thin Films", Materials Science Forum, Vols. 133-136, pp. 913-920, 1993

Online since:

January 1993

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$35.00

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