Paper Titles

X-Ray Analysis of Textures in Galvanic Copper Coatings Deposited at Different Temperatures
p.885

X-Ray Diffraction Characterisation of Polysilicon Layers
p.891

X-Ray Diffraction Studies of the Phase Formation in thin In/Ni Films
p.897

XRD-Investigations of Phase-Formation in High Dose Fe- and Co-Ion Co-implanted Si (100) Wafers
p.903

XRD on Polycrystalline Diamond Films obtained by CVD Technique
p.907

X-Ray Diffraction Examination of Structure and Stability of Amorphous Cu-W Thin Films
p.913

Grain-Size Determination by means of X-Ray and Neutron High-Angle Diffraction
p.921

Changes of Lattice Parameters in Small Particles of Hexagonal Crystals
p.927

Low Temperature Powder Diffraction on Vapour Deposited Disordered Solids
p.933

HomeMaterials Science ForumMaterials Science Forum Vols. 133-136XRD on Polycrystalline Diamond Films obtained by...

XRD on Polycrystalline Diamond Films obtained by CVD Technique

Article Preview

Abstract:

You might also be interested in these eBooks

$European Powder Diffraction EPDIC 2$ View Preview

Info:

Periodical:

Materials Science Forum (Volumes 133-136)

Pages:

907-912

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.133-136.907

Citation:

Cite this paper

Online since:

January 1993

Authors:

Giovanni Berti, E. Tognoni, M.L. Terranova, V. Sessa

Export:

RIS, BibTeX

Price:

Permissions CCC:

Request Permissions

Permissions PLS:

Request Permissions

Сopyright:

© 1993 Trans Tech Publications Ltd. All Rights Reserved

Share:

Citation: